New Phasor XS Allows All the Benefits Of Phased Array Inspection In A Conventional Portable Flaw Detector

Huerth, Germany –July 17, 2006. The new Phasor XS from GE Inspection Technologies offers phased array capability within a conventional, portable ultrasonic flaw detector to drastically reduce inspection times and improve probability of detection. It will find application throughout the whole aerospace process chain, from the manufacture of composite parts, structural sections and engine parts down to airframe and engine maintenance, repair and operations.

With its familiar operating platform and easy-to-understand, menu-driven inspection instructions, the new battery-powered instrument requires minimum operator training and brings phased array technology to routine manual inspection, such as airframe check procedures.

When used in phased array mode, the instrument offers up to128 individual channels and the operator can electronically multiplex a multi-element probe to achieve precise control over the angle of inspection, the amplitude and the depth of focus of each individual ultrasonic beam. The inspection image is presented as a full colour, sector B-scan on the unit’s high resolution TFT screen, providing comprehensive data in real time. Any of the A-scans which make up the sector scan can be selected for separate display or for simultaneous display with the sector image to allow instant and reliable sizing. Sector images and A-scans can be stored on a removable SD card for off-line data analysis and management.

A wide range of array probes are compatible with the new flaw detector, including dialog probes, containing probe identification data which can be transmitted back to the instrument to ensure increased inspection reliability, minimise set-up errors and assist in probe operation calculations. In conventional mode, the Phasor XS can use standard ultrasonic probes to carry out conventional inspection, including corrosion and thickness measurement.

Ruggedly packaged and weighing less than 4 kg, the Phasor XS is a logical progression of GE’s field-proven, flaw detection product range, offering an ideal entry-level phased array solution to manual volumetric inspections of a wide range of aircraft components. It will find application both for in-service inspections and also in the production environment where both GE’s LogiQ9 phased array system, which drives up to 1024 probe elements, and GE’s UTXX testing machine, which drives 128 elements for large, complex area scanning, are already widely used in the examination of aircraft engine forgings and airframe OEM composite components, respectively.

About GE Inspection Technologies
GE Inspection Technologies is a global leader in technology-driven inspection solutions that deliver productivity, quality and safety to our customers. The company designs, manufactures and services radiographic, ultrasonic, remote visual inspection and eddy current equipment to inspect, monitor and test materials and equipment without disassembly, deforming or damaging them. Its products are used in a wide range of industries, including Aerospace, Power Generation, Oil & Gas, Process and Automotive. The company has 11 application centers around the globe and offers a range of services including repair, on-site RVI inspection services, calibration, training and upgrades. GE Inspection Technologies has 1,300 employees at more than 25 facilities in 25 countries worldwide. To learn more about GE Inspection Technologies visit www.ge.com/inspectiontechnologies.

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