Accessoires for sample handling for XRD 3003 standard systems:

• Sample positioning tables with high spatial resolution
• Sample changer (incl. sample spinner)
• Capillary mount
• Environmental chambers for applications at high/low temperature, reactive surroundings or humidity (for PTS- or HR system high temperature only)
• Texture-Stress-Attachment open Eulerian cradle
  TSA 3 for XRD 3003 TT
• Reflectometry attachment with knife edge
• Oscillation devices

Plug-and-play X-ray optics for beam shaping on primary beam side for Bragg-Brentano, parallel beam and focussing geometry and for pure Kalpha1-radiation:

• Special high-flux optics for microdiffraction (min 100 µm spot)
• Collimators, high-flux optics
• Parabolic multilayer and/or channel cut monochromator
• Fully software controlled attenuator for high count rate dynamics
• 2D-collimating multilayer and double tilt stage (for in-plane GID, GISAXS)

Accessoires for secondary beam side:

• Gracing Incidence Device
• In-plane GID, GISAXS
• Channel cut analyser for triple crystal diffraction
  for PTS-HR
• Standard scintillation counters, nergy dispersive and high speed detectors

Additional Information